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Fault tolerant architectures in nanoelectronics: The progressive approach

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https://hal.telecom-paris.fr/hal-02286332
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Submitted on : Friday, September 13, 2019 - 3:37:11 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM

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  • HAL Id : hal-02286332, version 1

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Tian Ban, Lirida Alves de Barros Naviner. Fault tolerant architectures in nanoelectronics: The progressive approach. Southern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil. ⟨hal-02286332⟩

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