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Conference papers
Signal Probability, Reliability and Error Bound of Majority Voter in TMR
Tian Ban
Author
Lirida Alves de Barros Naviner 1, 2
Author
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Document type :
Conference papers
Complete list of metadatas
https://hal.telecom-paris.fr/hal-02286333
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 3:37:14 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 3:37:14 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM
Identifiers
- HAL Id : hal-02286333, version 1
Collections
LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH
Citation
Tian Ban, Lirida Alves de Barros Naviner. Signal Probability, Reliability and Error Bound of Majority Voter in TMR. IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States. ⟨hal-02286333⟩
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