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Conference papers

Signal Probability, Reliability and Error Bound of Majority Voter in TMR

Tian Ban Lirida Alves de Barros Naviner 1, 2 
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LTCI - Laboratoire Traitement et Communication de l'Information
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Submitted on : Friday, September 13, 2019 - 3:37:14 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

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  • HAL Id : hal-02286333, version 1

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Tian Ban, Lirida Alves de Barros Naviner. Signal Probability, Reliability and Error Bound of Majority Voter in TMR. IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States. ⟨hal-02286333⟩

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