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Selective Hardening Concerning Single and Multiple Faults

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https://hal.telecom-paris.fr/hal-02286334
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Submitted on : Friday, September 13, 2019 - 3:37:21 PM
Last modification on : Friday, September 18, 2020 - 7:50:03 AM

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Samuel Nascimento Pagliarini, Lirida Alves de Barros Naviner, Jean-François Naviner. Selective Hardening Concerning Single and Multiple Faults. Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France. ⟨hal-02286334⟩

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