Skip to Main content Skip to Navigation
Journal articles

A Hierarchical Reliability Simulation Methodology for AMS Integrated Circuits and Systems

Hao Cai 1, 2 J. F. Naviner H. Petit 3, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
3 C2S - Circuits et Systèmes de Communication
LTCI - Laboratoire Traitement et Communication de l'Information
Document type :
Journal articles
Complete list of metadata

https://hal.telecom-paris.fr/hal-02286422
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 3:43:41 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

Identifiers

  • HAL Id : hal-02286422, version 1

Citation

Hao Cai, J. F. Naviner, H. Petit. A Hierarchical Reliability Simulation Methodology for AMS Integrated Circuits and Systems. Journal of Low Power Electronics, 2012, 8 (5). ⟨hal-02286422⟩

Share

Metrics

Record views

56