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Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

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https://hal.telecom-paris.fr/hal-02286459
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 3:46:50 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

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  • HAL Id : hal-02286459, version 1

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Samuel Nascimento Pagliarini, Lirida Alves de Barros Naviner, Jean-François Naviner. Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening. European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France. ⟨hal-02286459⟩

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