A Fast Reliability-aware Approach for Analogue Integrated Circuits based on Pareto Fronts - Archive ouverte HAL Access content directly
Conference Papers Year : 2013
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hal-02286777 , version 1 (13-09-2019)

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  • HAL Id : hal-02286777 , version 1

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Hao Cai, H. Petit, J. F. Naviner. A Fast Reliability-aware Approach for Analogue Integrated Circuits based on Pareto Fronts. IEEE International NEWCAS Conference, Jun 2013, Paris, France. ⟨hal-02286777⟩
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