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Submitted on : Friday, September 13, 2019 - 4:13:30 PM Last modification on : Wednesday, September 30, 2020 - 8:54:16 AM
Kaikai Liu, Hao Cai, Ting An, Lirida Alves de Barros Naviner, Jean-François Naviner, et al.. Reliability analysis of combinational circuits with the influences of noise and single-event transients. IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States. ⟨hal-02286814⟩