Kaikai Liu, Hao Cai, Ting An, Lirida Alves de Barros Naviner, Jean-François Naviner, et al.. Reliability analysis of combinational circuits with the influences of noise and single-event transients.
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States.
⟨hal-02286814⟩