Skip to Main content Skip to Navigation
Conference papers

Reliability analysis of combinational circuits with the influences of noise and single-event transients

Kaikai Liu 1, 2 Hao Cai 1, 2 Ting An 1, 2 Lirida Alves de Barros Naviner 1, 2 Jean-François Naviner Hervé Petit 3, 2 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
3 C2S - Circuits et Systèmes de Communication
LTCI - Laboratoire Traitement et Communication de l'Information
Document type :
Conference papers
Complete list of metadata
https://hal.telecom-paris.fr/hal-02286814
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:13:30 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

Identifiers

  • HAL Id : hal-02286814, version 1

Collections

INSTITUT-TELECOM | PARISTECH | LTCI | COMELEC | C2S-CIRCUITS | SSH

Citation

Kaikai Liu, Hao Cai, Ting An, Lirida Alves de Barros Naviner, Jean-François Naviner, et al.. Reliability analysis of combinational circuits with the influences of noise and single-event transients. IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States. ⟨hal-02286814⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

9