Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

Yu-Ichi Hayashi; Naofumi Homma; Takaaki Mizuki; Takafumi Aoki; Hideaki Sone; Laurent Sauvage; Jean-Luc Danger

Journal Articles IEEE Transactions on Electromagnetic Compatibility Year : 2013

Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

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1
2

Yu-Ichi Hayashi

Function : Author

Naofumi Homma

Function : Author

Secure and Safe Hardware

Département Communications & Electronique

Takaaki Mizuki

Function : Author

Takafumi Aoki

Function : Author

Hideaki Sone

Function : Author
PersonId : 792906
ORCID : 0000-0002-9395-9987

Laurent Sauvage

Function : Author
PersonId : 177448
IdHAL : laurent-sauvage
ORCID : 0000-0002-6940-6856

Secure and Safe Hardware

Département Communications & Electronique

CV

Jean-Luc Danger

Function : Author
PersonId : 175676
IdHAL : jeanluc-danger
ORCID : 0000-0001-5063-7964

Secure and Safe Hardware

Département Communications & Electronique

CV

Domains

Engineering Sciences [physics] Electronics

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https://hal.telecom-paris.fr/hal-02286819

Submitted on : Friday, September 13, 2019-4:13:53 PM

Last modification on : Tuesday, February 28, 2023-3:36:25 PM

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hal-02286819 , version 1 (13-09-2019)

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HAL Id : hal-02286819 , version 1

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Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩

Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

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