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Journal articles
Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures
Yu-Ichi Hayashi
Naofumi Homma
1, 2
Takaaki Mizuki
Takafumi Aoki
Hideaki Sone
Laurent Sauvage
1, 2
Jean-Luc Danger
1, 2
Hideaki Sone
Author
Laurent Sauvage 1, 2
Mail :
Author IdHAL : laurent-sauvage
Jean-Luc Danger 1, 2
Mail : Site :
Author IdHAL : jeanluc-danger
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Document type :
Journal articles
Domain :
Complete list of metadatas
https://hal.telecom-paris.fr/hal-02286819
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:13:53 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:13:53 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM
Identifiers
- HAL Id : hal-02286819, version 1
Collections
LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH
Citation
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩
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