Skip to Main content Skip to Navigation
Journal articles

Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

yu-Ichi Hayashi Naofumi Homma 1, 2 Takaaki Mizuki Takafumi Aoki Hideaki Sone Laurent Sauvage 1, 2 Jean-Luc Danger 1, 2 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
Document type :
Journal articles
Complete list of metadata
https://hal.telecom-paris.fr/hal-02286819
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:13:53 PM
Last modification on : Thursday, November 18, 2021 - 1:02:02 PM

Identifiers

  • HAL Id : hal-02286819, version 1

Collections

INSTITUT-TELECOM | PARISTECH | LTCI | COMELEC | SSH

Citation

yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

21