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Journal articles
Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures
Yu-Ichi Hayashi
Naofumi Homma
1, 2
Takaaki Mizuki
Takafumi Aoki
Hideaki Sone
Laurent Sauvage
1, 2
Jean-Luc Danger
1, 2
Hideaki Sone
Author
Laurent Sauvage 1, 2
Author IdHAL : laurent-sauvage ORCID : https://orcid.org/0000-0002-6940-6856
Jean-Luc Danger 1, 2
Author IdHAL : jeanluc-danger
1
SSH - Secure and Safe Hardware (Télécom Paris 19 Place Marguerite Perey 91120 Palaiseau - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (Télécom Paris 19 Place Marguerite Perey 91120 PALAISEAU - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Document type :
Journal articles
Domain :
Complete list of metadata
https://hal.telecom-paris.fr/hal-02286819
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:13:53 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:13:53 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM
Identifiers
- HAL Id : hal-02286819, version 1
Collections
LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH
Citation
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩
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