Skip to Main content Skip to Navigation
Conference papers

Analytical method for reliability assessment of concurrent checking circuits under multiple faults

Ting An 1, 2 Kaikai Liu 1, 2 Lirida Alves de Barros Naviner 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
Complete list of metadata

https://hal.telecom-paris.fr/hal-02286867
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:17:49 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

Identifiers

  • HAL Id : hal-02286867, version 1

Collections

Citation

Ting An, Kaikai Liu, Lirida Alves de Barros Naviner. Analytical method for reliability assessment of concurrent checking circuits under multiple faults. MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia. ⟨hal-02286867⟩

Share

Metrics

Record views

51