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Analytical method for reliability assessment of concurrent checking circuits under multiple faults

Ting An 1, 2 Kaikai Liu 1, 2 Lirida Alves de Barros Naviner 1, 2 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
Keywords : concurrent error detection reliability assessment multiple faults soft errors
Document type :
Conference papers
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https://hal.telecom-paris.fr/hal-02286867
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:17:49 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

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  • HAL Id : hal-02286867, version 1

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INSTITUT-TELECOM | PARISTECH | LTCI | COMELEC | SSH

Citation

Ting An, Kaikai Liu, Lirida Alves de Barros Naviner. Analytical method for reliability assessment of concurrent checking circuits under multiple faults. MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia. ⟨hal-02286867⟩

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