Conference Papers
Year : 2014
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https://hal.telecom-paris.fr/hal-02286867
Submitted on : Friday, September 13, 2019-4:17:49 PM
Last modification on : Tuesday, February 28, 2023-3:36:25 PM
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- HAL Id : hal-02286867 , version 1
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Ting An, Kaikai Liu, Lirida Alves de Barros Naviner. Analytical method for reliability assessment of concurrent checking circuits under multiple faults. MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia. ⟨hal-02286867⟩
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