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Conference Papers Year : 2014

Analytical method for reliability assessment of concurrent checking circuits under multiple faults

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics Engineering Sciences [physics] Electronics

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Submitted on : Friday, September 13, 2019-4:17:49 PM

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hal-02286867 , version 1 (13-09-2019)

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  • HAL Id : hal-02286867 , version 1

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Ting An, Kaikai Liu, Lirida Alves de Barros Naviner. Analytical method for reliability assessment of concurrent checking circuits under multiple faults. MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia. ⟨hal-02286867⟩

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