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Journal Articles IEEE Transactions on Very Large Scale Integration (VLSI) Systems Year : 2015

A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation

Sho Endo
  • Function : Author
Yang Li
Kazuo Sakiyama
  • Function : Author
Kazuo Ohta
  • Function : Author
Daisuke Fujimoto
  • Function : Author
Makoto Nagata
  • Function : Author
Toshihiro Katashita
  • Function : Author
Takafumi Aoki
  • Function : Author
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hal-02287186 , version 1 (13-09-2019)

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Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, et al.. A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2015, ⟨10.1109/TVLSI.2014.2339892⟩. ⟨hal-02287186⟩
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