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Journal articles
A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation
Sho Endo
Yang Li
Naofumi Homma
1, 2
Kazuo Sakiyama
Kazuo Ohta
Daisuke Fujimoto
Makoto Nagata
Toshihiro Katashita
Jean-Luc Danger
1, 2
Takafumi Aoki
Jean-Luc Danger 1, 2
Mail : Site :
Author IdHAL : jeanluc-danger
Takafumi Aoki
Author
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Document type :
Journal articles
Domain :
Complete list of metadatas
https://hal.telecom-paris.fr/hal-02287186
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:41:22 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:41:22 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM
Identifiers
- HAL Id : hal-02287186, version 1
- DOI : 10.1109/TVLSI.2014.2339892
Collections
LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH | UNIV-PARIS-SACLAY
Citation
Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, et al.. A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation. IEEE transactions on VLSI systems, 2015, ⟨10.1109/TVLSI.2014.2339892⟩. ⟨hal-02287186⟩
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