Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

Hao Cai; You Wang; Lirida Alves de Barros Naviner; Weisheng Zhao

Journal articles

Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

Hao Cai ^{1, 2} You Wang ^{1, 2} Lirida Alves de Barros Naviner ^{1, 2} Weisheng Zhao

1 SSH - Secure and Safe Hardware

LTCI - Laboratoire Traitement et Communication de l'Information

2 COMELEC - Département Communications & Electronique

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Electronics

Complete list of metadata

https://hal.telecom-paris.fr/hal-02287224
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:44:36 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

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Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

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