Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology - Archive ouverte HAL Access content directly
Conference Papers Year : 2015

Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

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Engineering Sciences [physics] Electronics

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Submitted on : Friday, September 13, 2019-4:44:41 PM

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hal-02287226 , version 1 (13-09-2019)

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  • HAL Id : hal-02287226 , version 1

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Hao Cai, You Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2015, Toulouse, France. ⟨hal-02287226⟩

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