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Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology

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https://hal.telecom-paris.fr/hal-02287226
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:44:41 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:43 AM

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  • HAL Id : hal-02287226, version 1

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Hao Cai, You Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology. 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2015, Toulouse, France. ⟨hal-02287226⟩

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