A Tool for Transient Fault Analysis in Combinational Circuits

Mariem Slimani; Lirida A. B. Naviner

Conference Papers Year : 2015

A Tool for Transient Fault Analysis in Combinational Circuits

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Mariem Slimani

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Département Communications & Electronique

Lirida A. B. Naviner

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ORCID : 0000-0002-6320-4153

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Département Communications & Electronique

Keywords

Transient faults logic circuits masking effects reconvergent fanouts.

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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Submitted on : Friday, September 13, 2019-4:45:09 PM

Last modification on : Tuesday, February 28, 2023-3:36:25 PM

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hal-02287234 , version 1 (13-09-2019)

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HAL Id : hal-02287234 , version 1

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Mariem Slimani, Lirida A. B. Naviner. A Tool for Transient Fault Analysis in Combinational Circuits. IEEE International Conference on Electronics, Circuits, and Systems, Dec 2015, Caire, Egypt. ⟨hal-02287234⟩

A Tool for Transient Fault Analysis in Combinational Circuits

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