Service interruption on Monday 11 July from 12:30 to 13:00: all the sites of the CCSD (HAL, Epiciences, SciencesConf, AureHAL) will be inaccessible (network hardware connection).
Skip to Main content Skip to Navigation
Conference papers

A Model-Based Testing Process for Enhancing Structural Coverage in Functional Testing

yanjun Sun 1, 2 Gérard Memmi 1, 2 Sylvie Vignes 1, 2 
1 ACES - Autonomic and Critical Embedded Systems
LTCI - Laboratoire Traitement et Communication de l'Information
Document type :
Conference papers
Complete list of metadata

https://hal.telecom-paris.fr/hal-02287374
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:54:32 PM
Last modification on : Wednesday, November 3, 2021 - 6:22:43 AM

Identifiers

  • HAL Id : hal-02287374, version 1

Citation

yanjun Sun, Gérard Memmi, Sylvie Vignes. A Model-Based Testing Process for Enhancing Structural Coverage in Functional Testing. Int. Conf. CSDM Asia, Feb 2016, Singapore, Singapore. pp.171-180. ⟨hal-02287374⟩

Share

Metrics

Record views

29