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Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters

Mariem Slimani 1, 2 Lirida Alves de Barros Naviner 1, 2 You Wang 1, 2 Hao Cai 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
Abstract : Majority voters are typically used in redundancy hardening techniques aiming to increase the reliability of nanoscale circuits. Besides, Spin Transfer Torque Magnetic Tunnel Junction (STT-MJT) has been identified as the most promising candidate for low power and high speed applications. In this paper, we present two majority voter circuits based on nanometer STT-MTJ. By using STMicroelectronics FDSOI 28 nm process and a precise STT-MTJ compact model, electrical simulations have been carried out to compare their performances and analyze their reliability. Both radiation sensitivity and variability have been investigated in the reliability-aware analysis.
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Submitted on : Friday, September 13, 2019 - 4:59:42 PM
Last modification on : Wednesday, October 27, 2021 - 6:49:23 AM

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Mariem Slimani, Lirida Alves de Barros Naviner, You Wang, Hao Cai. Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters. Microelectronics Reliability, Elsevier, 2016, C (64), pp.48-53. ⟨hal-02287469⟩

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