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Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology

Hao Cai 1, 2 you Wang 1, 2 Lirida Alves de Barros Naviner 1, 2 Weisheng Zhao 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
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Submitted on : Friday, September 13, 2019 - 4:59:48 PM
Last modification on : Wednesday, November 3, 2021 - 6:18:56 AM

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  • HAL Id : hal-02287471, version 1

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Hao Cai, you Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2016, 16 (3), pp.376-383. ⟨hal-02287471⟩

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