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Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology

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https://hal.telecom-paris.fr/hal-02287471
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Submitted on : Friday, September 13, 2019 - 4:59:48 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:44 AM

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Hao Cai, You Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2016, 16 (3), pp.376-383. ⟨hal-02287471⟩

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