Skip to Main content Skip to Navigation
Journal articles

Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology

Complete list of metadatas

https://hal.telecom-paris.fr/hal-02287471
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 4:59:48 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:53 PM

Identifiers

  • HAL Id : hal-02287471, version 1

Citation

Hao Cai, You Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2016, 16 (3), pp.376-383. ⟨hal-02287471⟩

Share

Metrics

Record views

32