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Efficient reliability evaluation methodologies for combinational circuits

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https://hal.telecom-paris.fr/hal-02287474
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Submitted on : Friday, September 13, 2019 - 4:59:52 PM
Last modification on : Wednesday, May 26, 2021 - 5:02:09 PM

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Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner, You Wang, Mariem Slimani, et al.. Efficient reliability evaluation methodologies for combinational circuits. Microelectronics Reliability, Elsevier, 2016, 64. ⟨hal-02287474⟩

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