Efficient reliability evaluation methodologies for combinational circuits

Hao Cai; Kaikai Liu; Lirida Alves de Barros Naviner; you Wang; Mariem Slimani; Jean-François Naviner

Journal articles

Efficient reliability evaluation methodologies for combinational circuits

Hao Cai ^{1, 2} Kaikai Liu ^{1, 2} Lirida Alves de Barros Naviner ^{1, 2} you Wang ^{1, 2} Mariem Slimani ^{1, 2} Jean-François Naviner

1 SSH - Secure and Safe Hardware

LTCI - Laboratoire Traitement et Communication de l'Information

2 COMELEC - Département Communications & Electronique

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Complete list of metadata

https://hal.telecom-paris.fr/hal-02287474
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 4:59:52 PM
Last modification on : Wednesday, November 3, 2021 - 6:18:52 AM

Efficient reliability evaluation methodologies for combinational circuits

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Efficient reliability evaluation methodologies for combinational circuits

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