Journal Articles
Microelectronics Reliability
Year : 2016
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https://hal.telecom-paris.fr/hal-02287474
Submitted on : Friday, September 13, 2019-4:59:52 PM
Last modification on : Tuesday, February 28, 2023-3:36:25 PM
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- HAL Id : hal-02287474 , version 1
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Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner, You Wang, Mariem Slimani, et al.. Efficient reliability evaluation methodologies for combinational circuits. Microelectronics Reliability, 2016, 64. ⟨hal-02287474⟩
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