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Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy

Weisheng Zhao you Wang 1, 2 Lirida Alves de Barros Naviner 1, 2 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
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Journal articles
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https://hal.telecom-paris.fr/hal-02287641
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 5:10:19 PM
Last modification on : Wednesday, November 3, 2021 - 6:18:39 AM

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  • HAL Id : hal-02287641, version 1

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INSTITUT-TELECOM | PARISTECH | UNIV-PARIS-SACLAY | LTCI | COMELEC | SSH

Citation

Weisheng Zhao, you Wang, Lirida Alves de Barros Naviner. Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy. Materials Science Journal, 2017, 9 (41), pp.1-17. ⟨hal-02287641⟩

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