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Journal articles
Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Document type :
Journal articles
Complete list of metadatas
https://hal.telecom-paris.fr/hal-02287641
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:10:19 PM
Last modification on : Friday, July 31, 2020 - 11:28:08 AM
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:10:19 PM
Last modification on : Friday, July 31, 2020 - 11:28:08 AM
Identifiers
- HAL Id : hal-02287641, version 1
Collections
LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH | UNIV-PARIS-SACLAY
Citation
Weisheng Zhao, You Wang, Lirida Alves de Barros Naviner. Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy. Materials Science Journal, 2017, 9 (41), pp.1-17. ⟨hal-02287641⟩
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