Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, F. Abouzeid, et al.. Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test.
Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States.
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