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Conference papers
Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test
Cyril Bottoni
1, 2
Benjamin Coeffic
Jean-Marc Daveau
Gilles Gasiot
F. Abouzeid
S. Clerc
Lirida Alves de Barros Naviner
Philippe Roche
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Complete list of metadatas
https://hal.telecom-paris.fr/hal-02287890
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:27:59 PM
Last modification on : Thursday, March 5, 2020 - 4:02:25 PM
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:27:59 PM
Last modification on : Thursday, March 5, 2020 - 4:02:25 PM
Identifiers
- HAL Id : hal-02287890, version 1
Collections
LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH | UNIV-PARIS-SACLAY
Citation
Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, F. Abouzeid, et al.. Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test. Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States. ⟨hal-02287890⟩
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