Skip to Main content Skip to Navigation
Conference papers

Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test

Complete list of metadatas

https://hal.telecom-paris.fr/hal-02287890
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:27:59 PM
Last modification on : Thursday, March 5, 2020 - 4:02:25 PM

Identifiers

  • HAL Id : hal-02287890, version 1

Citation

Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, F. Abouzeid, et al.. Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test. Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States. ⟨hal-02287890⟩

Share

Metrics

Record views

28