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Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test

Cyril Bottoni 1, 2 Benjamin Coeffic Jean-Marc Daveau Gilles Gasiot F. Abouzeid S. Clerc Lirida Alves de Barros Naviner Philippe Roche 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
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Conference papers
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https://hal.telecom-paris.fr/hal-02287890
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Friday, September 13, 2019 - 5:27:59 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:44 AM

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  • HAL Id : hal-02287890, version 1

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INSTITUT-TELECOM | PARISTECH | UNIV-PARIS-SACLAY | LTCI | COMELEC | SSH

Citation

Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, F. Abouzeid, et al.. Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test. Proceedings of IEEE International Reliability Physics Symposium (IRPS), Apr 2015, Monterrey, CA, United States. ⟨hal-02287890⟩

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