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Journal articles
Impact of Aging on the Reliability of Delay PUFs
Naghmeh Karimi
Author
Jean-Luc Danger 1, 2
Mail : Site :
Author IdHAL : jeanluc-danger
Sylvain Guilley 1, 2
Mail :
Author IdHAL : sylvain-guilley ORCID : https://orcid.org/0000-0002-5044-3534
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Document type :
Journal articles
Complete list of metadatas
https://hal.telecom-paris.fr/hal-02287976
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:33:26 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:54 PM
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:33:26 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:54 PM
Identifiers
- HAL Id : hal-02287976, version 1
- DOI : 10.1007/s10836-018-5745-6
Collections
INSMI | LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | SSH | UNIV-PARIS-SACLAY
Citation
Naghmeh Karimi, Jean-Luc Danger, Sylvain Guilley. Impact of Aging on the Reliability of Delay PUFs. Journal of Electronic Testing, 2018, 34 (5), pp.571-586. ⟨10.1007/s10836-018-5745-6⟩. ⟨hal-02287976⟩
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