Journal Articles
Microelectronics Reliability
Year : 2018
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https://hal.telecom-paris.fr/hal-02287982
Submitted on : Friday, September 13, 2019-5:33:46 PM
Last modification on : Tuesday, February 28, 2023-3:36:25 PM
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- HAL Id : hal-02287982 , version 1
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Nilson Maciel, Elaine Crespo Marques, Lirida Alves de Barros Naviner, Hao Cai. Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology. Microelectronics Reliability, 2018, 88-90, pp.965-968. ⟨hal-02287982⟩
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