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Journal Articles Microelectronics Reliability Year : 2018

Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics Engineering Sciences [physics] Electronics

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Submitted on : Friday, September 13, 2019-5:33:46 PM

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hal-02287982 , version 1 (13-09-2019)

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  • HAL Id : hal-02287982 , version 1

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Nilson Maciel, Elaine Crespo Marques, Lirida Alves de Barros Naviner, Hao Cai. Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology. Microelectronics Reliability, 2018, 88-90, pp.965-968. ⟨hal-02287982⟩

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