Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

Nilson Maciel; Elaine Crespo Marques; Lirida Alves de Barros Naviner; Hao Cai

Journal articles

Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

Nilson Maciel Elaine Crespo Marques ^{1, 2} Lirida Alves de Barros Naviner ^{1, 2} Hao Cai ^{1, 2}

1 SSH - Secure and Safe Hardware

LTCI - Laboratoire Traitement et Communication de l'Information

2 COMELEC - Département Communications & Electronique

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Engineering Sciences [physics] / Electronics

Complete list of metadatas

https://hal.telecom-paris.fr/hal-02287982
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:33:46 PM
Last modification on : Friday, September 18, 2020 - 7:50:03 AM

Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

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Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

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