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Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

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https://hal.telecom-paris.fr/hal-02287982
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Submitted on : Friday, September 13, 2019 - 5:33:46 PM
Last modification on : Wednesday, November 3, 2021 - 6:20:53 AM

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  • HAL Id : hal-02287982, version 1

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Nilson Maciel, Elaine Crespo Marques, Lirida Alves de Barros Naviner, Hao Cai. Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology. Microelectronics Reliability, Elsevier, 2018, 88-90, pp.965-968. ⟨hal-02287982⟩

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