Skip to Main content Skip to Navigation
Journal articles

Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology

Complete list of metadatas

https://hal.telecom-paris.fr/hal-02287982
Contributor : Telecomparis Hal <>
Submitted on : Friday, September 13, 2019 - 5:33:46 PM
Last modification on : Friday, September 18, 2020 - 7:50:03 AM

Identifiers

  • HAL Id : hal-02287982, version 1

Citation

Nilson Maciel, Elaine Crespo Marques, Lirida Alves de Barros Naviner, Hao Cai. Single-event transient effects on dynamic comparator in 28nm FDSOI CMOS technology. Microelectronics Reliability, 2018, 88-90, pp.965-968. ⟨hal-02287982⟩

Share

Metrics

Record views

37