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Conference Papers Year : 2012

Reliability estimation methods : Tradeoffs between complexity and accuracy

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal.telecom-paris.fr/hal-02288322

Submitted on : Saturday, September 14, 2019-6:41:25 PM

Last modification on : Tuesday, February 28, 2023-3:36:23 PM

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hal-02288322 , version 1 (14-09-2019)

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  • HAL Id : hal-02288322 , version 1

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Samuel Nascimento Pagliarini, Denis Teixeira Franco, Lirida Alves de Barros Naviner, Jean-François Naviner. Reliability estimation methods : Tradeoffs between complexity and accuracy. Southern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil. ⟨hal-02288322⟩

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