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Parametric Statistical Modeling of Power Gain Patterns for RFID Backscattering Channels

Zeinab Mhanna 1, 2 Alain Sibille 1, 2 Muhammad Amir Yousuf Christophe Roblin 1, 2
1 RFM2 - Radio-Fréquences Microondes et Ondes Millimétriques
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
Abstract : We describe a statistical model of the power gain patterns of a set of planar antennas, randomly generated from a starting parameterized design. It is first based on a spherical harmonics and double Fourier series expansion for each antenna pattern, followed by the statistical model of the expansion coefficients over the full set. This double compression method results in only a few tens of parameters to reconstruct all patterns. The method fails at the poles when it is applied to a polarization component of the pattern but this does not appear to be a critical problem.
Keywords : ultrawideband (UWB) antennas tag antenna radiation patterns spherical harmonics expansion double Fourier series expansion statistical model
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Conference papers
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https://hal.telecom-paris.fr/hal-02288332
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Saturday, September 14, 2019 - 6:41:56 PM
Last modification on : Tuesday, October 19, 2021 - 11:15:41 AM

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  • HAL Id : hal-02288332, version 1

Collections

LTCI | PARISTECH | INSTITUT-TELECOM | COMELEC | RFM2

Citation

Zeinab Mhanna, Alain Sibille, Muhammad Amir Yousuf, Christophe Roblin. Parametric Statistical Modeling of Power Gain Patterns for RFID Backscattering Channels. European Conference on Antennas & propagation, Mar 2012, Prague, Czech Republic. pp.1041 -1045. ⟨hal-02288332⟩

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