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Simulation Study of Aging in CMOS Binary Adders

Ting An 1, 2 Hao Cai 1, 2 Lirida Alves de Barros Naviner 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
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https://hal.telecom-paris.fr/hal-02288395
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Submitted on : Saturday, September 14, 2019 - 6:45:52 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:44 AM

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Ting An, Hao Cai, Lirida Alves de Barros Naviner. Simulation Study of Aging in CMOS Binary Adders. MIPRO 37th International Convention/Microelectronics, Electronics and Electronic Technology, May 2014, Opatija, Croatia. ⟨hal-02288395⟩

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