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A Layout-Based Fault Injection Methodology for SER Prediction: Implementation and Correlation with 65nm Heavy Ion Experimental Results

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https://hal.telecom-paris.fr/hal-02288532
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Saturday, September 14, 2019 - 6:55:20 PM
Last modification on : Wednesday, October 27, 2021 - 6:43:46 AM

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  • HAL Id : hal-02288532, version 1

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Benjamin Coeffic, Victor Malherbe, Jean-Marc Daveau, Gilles Gasiot, Lirida A. B. Naviner, et al.. A Layout-Based Fault Injection Methodology for SER Prediction: Implementation and Correlation with 65nm Heavy Ion Experimental Results. Proceedings of IEEE Nuclear and Space Radiation Effects Conference (NSREC), Jul 2016, New Orleans, United States. ⟨hal-02288532⟩

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