Annelie Heuser, Sylvain Guilley, Olivier Rioul. Success metric: An all-in-one criterion for comparing side-channel distinguishers. Guido Bertoni; Jean-Sébastien Coron.
15th Workshop on Cryptographic Hardware and Embedded Systems (CHES 2013), Aug 2013, Santa Barbara, CA, United States.
Springer, Lecture Notes in Computer Science, 8086, Cryptographic Hardware and Embedded Systems - CHES 2013 15th International Workshop, Santa Barbara, CA, USA, August 20-23, 2013. Proceedings.
⟨hal-02299990⟩