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Characterization at Logical Level of Magnetic Injection Probes

Oualid Trabelsi 1, 2 Laurent Sauvage 1, 2 Jean-Luc Danger 1, 2 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
Abstract : Intentional electromagnetic interference is an effective mean to jeopardize the security of integrated circuits. In this paper, we propose a new approach to evaluate the efficiency of magnetic probes used to radiate a disturbance: measuring its impact within the target of the attack, more precisely on the propagation delay of a combinational path. The characterization of five probes carried out using three different integrated circuits is reported. In all cases, bespoke, handmade probes outperform commercial ones. Experimental results also show that the electromagnetic coupling between the probes and the integrated circuits is mainly due to global, bonding wires.
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Submitted on : Thursday, October 17, 2019 - 1:24:30 PM
Last modification on : Thursday, November 18, 2021 - 1:02:02 PM
Long-term archiving on: : Saturday, January 18, 2020 - 2:23:57 PM


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  • HAL Id : hal-02318716, version 1


Oualid Trabelsi, Laurent Sauvage, Jean-Luc Danger. Characterization at Logical Level of Magnetic Injection Probes. 2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility, Jun 2019, Sapporo, Japan. ⟨hal-02318716⟩



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