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A Fault Model for Conducted Intentional ElectroMagnetic Interferences

Laurent Sauvage 1, 2 Sylvain Guilley 1, 2 Jean-Luc Danger 1, 2 Naofumi Homma 1, 2 yu-Ichi Hayashi 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
Abstract : Experimental setups used in electromagnetic compatibility tests can be used as platforms for fault injections. Faulting an equipment is a mean for a malevolent attacker to extract secret information. Compared to other fault injection setups, those based on EMC tests provide three advantages: non-invasivity, absence of synchronization, and frequency selectivity. This injection technique therefore allows the attacker to perform analysis with little knowledge of the targeted equipment. To assess the potential of this attack, a characterization of its effects is needed. This is the purpose of this paper. More precisely, our contributions are twofold: first of all, we observe that the faults are reproducible. Second, we show that the fault model is compatible with known attacks.
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Submitted on : Sunday, December 15, 2019 - 12:35:51 PM
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Laurent Sauvage, Sylvain Guilley, Jean-Luc Danger, Naofumi Homma, yu-Ichi Hayashi. A Fault Model for Conducted Intentional ElectroMagnetic Interferences. EMC, Aug 2012, Pittsburgh, United States. pp.788-793, ⟨10.1109/ISEMC.2012.6351664⟩. ⟨hal-02411875⟩



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