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Reliability Analysis of a Reed-Solomon Decoder

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https://hal.telecom-paris.fr/hal-02411876
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Submitted on : Sunday, December 15, 2019 - 12:35:54 PM
Last modification on : Wednesday, January 8, 2020 - 1:06:13 AM

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Kaikai Liu, Tian Ban, Lirida Alves de Barros Naviner, Jean-François Naviner. Reliability Analysis of a Reed-Solomon Decoder. IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States. ⟨hal-02411876⟩

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