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Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis

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https://hal.telecom-paris.fr/hal-02411994
Contributor : Telecomparis Hal <>
Submitted on : Sunday, December 15, 2019 - 12:40:49 PM
Last modification on : Friday, July 31, 2020 - 11:28:08 AM

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  • HAL Id : hal-02411994, version 1

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Samuel Nascimento Pagliarini, Tian Ban, Lirida Alves de Barros Naviner, Jean-François Naviner. Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis. Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States. ⟨hal-02411994⟩

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