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Conference papers

Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis

Samuel Nascimento Pagliarini 1, 2 Tian Ban Lirida Alves de Barros Naviner 1, 2 Jean-François Naviner 3
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
3 LTCI - Laboratoire Traitement et Communication de l'Information
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Conference papers
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https://hal.telecom-paris.fr/hal-02411994
Contributor : Telecomparis Hal Connect in order to contact the contributor
Submitted on : Sunday, December 15, 2019 - 12:40:49 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:45 AM

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  • HAL Id : hal-02411994, version 1

Collections

PARISTECH | COMELEC | SSH | LTCI | CNRS | INSTITUT-TELECOM

Citation

Samuel Nascimento Pagliarini, Tian Ban, Lirida Alves de Barros Naviner, Jean-François Naviner. Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis. Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States. ⟨hal-02411994⟩

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