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Conference papers
Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis
Samuel Nascimento Pagliarini
1, 2
Tian Ban
Lirida Alves de Barros Naviner
1, 2
Jean-François Naviner
3
Samuel Nascimento Pagliarini 1, 2
Author
Tian Ban
Author
Lirida Alves de Barros Naviner 1, 2
Author IdHAL : lirida-naviner
Jean-François Naviner 3
Author
1
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- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
3
LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- CNRS - Centre National de la Recherche Scientifique : UMR5141 (France)
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Conference papers
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https://hal.telecom-paris.fr/hal-02411994
Contributor : Telecomparis Hal <>
Submitted on : Sunday, December 15, 2019 - 12:40:49 PM
Last modification on : Wednesday, September 30, 2020 - 8:54:16 AM
Contributor : Telecomparis Hal <>
Submitted on : Sunday, December 15, 2019 - 12:40:49 PM
Last modification on : Wednesday, September 30, 2020 - 8:54:16 AM
Identifiers
- HAL Id : hal-02411994, version 1
Citation
Samuel Nascimento Pagliarini, Tian Ban, Lirida Alves de Barros Naviner, Jean-François Naviner. Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis. Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States. ⟨hal-02411994⟩
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