Samuel Nascimento Pagliarini, Tian Ban, Lirida Alves de Barros Naviner, Jean-François Naviner. Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence Analysis.
Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States.
⟨hal-02411994⟩