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Limitations of Fault Injection Attack Based on Immunity to Radiated EM Field Standards

Laurent Sauvage 1, 2
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
Abstract : Fault injection using electromagnetic pulse is a promising technique for extracting secrets from an integrated circuit. Indeed, among other benefits, it does not need a preparation phase, delicate and costly, as attack using a LASER does. In the field of electromagnetic compatibility, a large set of standards describe how to assess the immunity to electromagnetic radiations of a system or an integrated circuit. In this paper, we show the limitations of their usage to carry out fault injection attack.
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Conference papers
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https://hal.telecom-paris.fr/hal-02412018
Contributor : Telecomparis Hal <>
Submitted on : Sunday, December 15, 2019 - 12:41:51 PM
Last modification on : Wednesday, October 14, 2020 - 4:14:37 AM

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  • HAL Id : hal-02412018, version 1

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Laurent Sauvage. Limitations of Fault Injection Attack Based on Immunity to Radiated EM Field Standards. EMC Europe, Sep 2013, Brugge, Belgium. ⟨hal-02412018⟩

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