Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops - Archive ouverte HAL Access content directly
Conference Papers Year : 2014

Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal.telecom-paris.fr/hal-02412061

Submitted on : Sunday, December 15, 2019-12:43:45 PM

Last modification on : Tuesday, February 28, 2023-3:36:25 PM

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hal-02412061 , version 1 (15-12-2019)

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  • HAL Id : hal-02412061 , version 1

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Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner. Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops. 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland. ⟨hal-02412061⟩

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