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Flip-flop selection for in-situ slack-time monito- ring based on the activation probability of timing-critical paths.

Keywords : test
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Conference papers
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https://hal.telecom-paris.fr/hal-02412072
Contributor : Telecomparis Hal <>
Submitted on : Sunday, December 15, 2019 - 12:44:23 PM
Last modification on : Wednesday, June 24, 2020 - 4:19:55 PM

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  • HAL Id : hal-02412072, version 1

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Sébastien Sarrazin, Samuel Evain, Ivan Miro Panades, Alexandre Valentian, Lirida Alves de Barros Naviner, et al.. Flip-flop selection for in-situ slack-time monito- ring based on the activation probability of timing-critical paths.. IEEE International On-line Test Symposium, Jul 2014, Platja d'Aro, Spain. ⟨hal-02412072⟩

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