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Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor

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https://hal.telecom-paris.fr/hal-02412075
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Sunday, December 15, 2019 - 12:44:29 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:45 AM

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  • HAL Id : hal-02412075, version 1

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Cyril Bottoni, Jean-Marc Daveau, Gilles Gasiot, Lirida Alves de Barros Naviner, Philippe Roche. Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor. IEEE International Reliability Physics Symposium, Jun 2014, Waikoloa, Hawai, United States. ⟨hal-02412075⟩

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