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Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor

Cyril Bottoni 1, 2 Jean-Marc Daveau Gilles Gasiot Lirida Alves de Barros Naviner 1, 2 Philippe Roche 
1 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
2 COMELEC - Département Communications & Electronique
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Conference papers
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https://hal.telecom-paris.fr/hal-02412075
Contributor : TelecomParis HAL Connect in order to contact the contributor
Submitted on : Sunday, December 15, 2019 - 12:44:29 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:45 AM

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  • HAL Id : hal-02412075, version 1

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INSTITUT-TELECOM | PARISTECH | LTCI | COMELEC | SSH

Citation

Cyril Bottoni, Jean-Marc Daveau, Gilles Gasiot, Lirida Alves de Barros Naviner, Philippe Roche. Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor. IEEE International Reliability Physics Symposium, Jun 2014, Waikoloa, Hawai, United States. ⟨hal-02412075⟩

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