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Conference papers
Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor
Cyril Bottoni
1, 2
Jean-Marc Daveau
Gilles Gasiot
Lirida Alves de Barros Naviner
1, 2
Philippe Roche
Cyril Bottoni 1, 2
Author
Jean-Marc Daveau
Author
Gilles Gasiot
Author
Lirida Alves de Barros Naviner 1, 2
Author
Philippe Roche
Author
1
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (46 rue Barrault F-75634 Paris Cedex 13 - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
Document type :
Conference papers
Complete list of metadatas
https://hal.telecom-paris.fr/hal-02412075
Contributor : Telecomparis Hal <>
Submitted on : Sunday, December 15, 2019 - 12:44:29 PM
Last modification on : Friday, July 31, 2020 - 11:28:08 AM
Contributor : Telecomparis Hal <>
Submitted on : Sunday, December 15, 2019 - 12:44:29 PM
Last modification on : Friday, July 31, 2020 - 11:28:08 AM
Identifiers
- HAL Id : hal-02412075, version 1
Collections
PARISTECH | COMELEC | SSH | LTCI | INSTITUT-TELECOM
Citation
Cyril Bottoni, Jean-Marc Daveau, Gilles Gasiot, Lirida Alves de Barros Naviner, Philippe Roche. Heavy ions test result on a 65nm sparc-v8 radiation-hard microprocessor. IEEE International Reliability Physics Symposium, Jun 2014, Waikoloa, Hawai, United States. ⟨hal-02412075⟩
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