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Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit Level

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https://hal.telecom-paris.fr/hal-02412466
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Submitted on : Sunday, December 15, 2019 - 3:04:38 PM
Last modification on : Tuesday, October 19, 2021 - 11:16:45 AM

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  • HAL Id : hal-02412466, version 1

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Samuel Nascimento Pagliarini, Lirida Alves de Barros Naviner, Jean-François Naviner. Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit Level. IEEE International Conference of Electronics, Circuits and Systems (ICECS), Dec 2013, Abu Dhabi, United Arab Emirates. ⟨hal-02412466⟩

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