A. Barenghi, L. Breveglieri, I. Koren, and D. Naccache, Fault injection attacks on cryptographic devices: Theory, practice, and countermeasures, Proceedings of the IEEE, vol.100, pp.3056-3076, 2012.
URL : https://hal.archives-ouvertes.fr/hal-01110932

D. Boneh, R. A. Demillo, and R. J. Lipton, On the importance of checking cryptographic protocols for faults, Advances in Cryptology, International Conference on the Theory and Application of Cryptographic Techniques, 1997.

L. Dureuil, G. Petiot, M. Potet, T. Le, A. Crohen et al., FISSC: A fault injection and simulation secure collection, International Conference on Computer Safety, Reliability, and Security, 2016.

G. Piret and J. Quisquater, A differential fault attack technique against SPN structures, with application to the AES and Khazad, Cryptographic Hardware and Embedded Systems, 2003.

J. Dutertre, V. Beroulle, P. Candelier, S. Castro, L. Faber et al., Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model, 2018.
URL : https://hal.archives-ouvertes.fr/emse-01856008

S. Buchner, F. Miller, V. Pouget, and D. Mcmorrow, Pulsed-laser testing for single-event effects investigations, IEEE Transactions on, vol.60, issue.3, pp.1852-1875, 2013.
URL : https://hal.archives-ouvertes.fr/hal-01633917

A. Dehbaoui, J. Dutertre, B. Robisson, and A. Tria, Electromagnetic transient faults injection on a hardware and a software implementations of AES, Workshop on Fault Diagnosis and, pp.7-15, 2012.
URL : https://hal.archives-ouvertes.fr/emse-00742639

M. Lacruche, N. Borrel, C. Champeix, C. Roscian, A. Sarafianos et al., Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses, On-Line Testing Symposium, 2015.
URL : https://hal.archives-ouvertes.fr/emse-01227286

L. Rivière, Z. Najm, P. Rauzy, J. Danger, and J. Bringer, High precision fault attacks on the instruction cache of ARMv7-M architectures, 2015 IEEE International Symposium on Hardware Oriented Security and Trust, 2015.

A. Cui and R. Housley, BADFET: Defeating modern secure boot using second-order pulsed electromagnetic fault injection, USENIX Workshop on Offensive Technologies (WOOT 17), 2017.

A. Beckers, J. Balasch, B. Gierlichs, I. Verbauwhede, S. Osuka et al., Characterization of EM faults on ATmega328P, International Symposium on Electromagnetic Compatibility, 2019.

N. Moro, A. Dehbaoui, K. Heydemann, B. Robisson, and E. Encrenaz, Electromagnetic fault injection: Towards a fault model on a 32-bit microcontroller, Workshop on Fault Diagnosis and Tolerance in Cryptography, pp.77-88, 2013.
URL : https://hal.archives-ouvertes.fr/emse-00871218

N. Moro, K. Heydemann, E. Encrenaz, and B. Robisson, Formal verification of a software countermeasure against instruction skip attacks, Journal of Cryptographic Engineering, vol.4, issue.3, pp.145-156, 2014.
URL : https://hal.archives-ouvertes.fr/emse-00951386

N. Moro, K. Heydemann, A. Dehbaoui, B. Robisson, and E. Encrenaz, Experimental evaluation of two software countermeasures against fault attacks, Hardware-Oriented Security and Trust, 2014.
URL : https://hal.archives-ouvertes.fr/emse-01032449

J. Balasch, B. Gierlichs, and I. Verbauwhede, An in-depth and blackbox characterization of the effects of clock glitches on 8-bit MCUs, Fault Diagnosis and Tolerance in Cryptography, 2011.

L. Cojocar, K. Papagiannopoulos, and N. Timmers, Instruction duplication: Leaky and not too fault-tolerant!" in Smart Card Research and Advanced Applications, ser. Lecture Notes in Computer Science, vol.10728, pp.160-179, 2017.

J. Proy, K. Heydemann, F. Majéric, A. Cohen, and A. Berzati, Studying EM pulse effects on superscalar microarchitectures at ISA level, CoRR, 2019.
URL : https://hal.archives-ouvertes.fr/hal-02102373

J. Breier, D. Jap, and C. Chen, Laser profiling for the back-side fault attacks: With a practical laser skip instruction attack on AES, Proceedings of the 1st ACM Workshop on Cyber-Physical System Security, 2015.

D. Kumar, A. Beckers, J. Balasch, B. Gierlichs, and I. Verbauwhede, An in-depth and black-box characterization of the effects of laser pulses on ATmega328P, Smart Card Research and Advanced Applications, 2018.

E. Trichina and R. Korkikyan, Multi fault laser attacks on protected CRT-RSA, Fault Diagnosis and Tolerance in Cryptography, 2010.

J. Dutertre, T. Riom, O. Potin, and J. Rigaud, Experimental analysis of the laser-induced instruction skip fault model, The 24th Nordic Conference on Secure IT Systems, pp.221-237, 2019.
URL : https://hal.archives-ouvertes.fr/hal-02379754

B. Yuce, N. F. Ghalaty, H. Santapuri, C. Deshpande, C. Patrick et al., Software fault resistance is futile: Effective singleglitch attacks, 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2016.

M. Ehlmor, Embedded systems security: On em fault injection on risc-v and br/tbr puf design on fpga, 2020.

L. Zussa, A. Dehbaoui, K. Tobich, J. Dutertre, P. Maurine et al., Efficiency of a glitch detector against electromagnetic fault injection, Design, Automation and Test in Europe Conference and Exhibition (DATE), pp.1-6, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-01096047

S. Ordas, L. Guillaume-sage, and P. Maurine, Electromagnetic fault injection: the curse of flip-flops, Journal of Cryptographic Engineering, vol.7, issue.3, pp.183-197, 2017.
URL : https://hal.archives-ouvertes.fr/lirmm-01430913

M. Dumont, P. Maurine, and M. Lisart, Electromagnetic fault injection: how faults occur, 2019 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), ser. 15th Workshop on Fault Diagnosis and Tolerance in Cryptography, 2019.
URL : https://hal.archives-ouvertes.fr/lirmm-02328109

M. Ghodrati, B. Yuce, S. Gujar, C. Deshpande, L. Nazhandali et al., Inducing local timing fault through em injection, Proceedings -Design Automation Conference, ser. DAC '18, vol.137710, pp.1-142, 2018.

L. Zussa, J. Dutertre, J. Clédiere, and B. Robisson, Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter, Hardware-Oriented Security and Trust (HOST), 2014.
URL : https://hal.archives-ouvertes.fr/emse-01099010