Effect of Aging on PUF Modeling Attacks based on Power Side-Channel Observations - Archive ouverte HAL

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Effect of Aging on PUF Modeling Attacks based on Power Side-Channel Observations

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Jean-Luc Danger

Function : Author
PersonId : 175676
IdHAL : jeanluc-danger
ORCID : 0000-0001-5063-7964

Département Communications & Electronique

Secure and Safe Hardware

Laboratoire Traitement et Communication de l'Information

Wei Cheng

Function : Author
PersonId : 751842
IdHAL : wei-cheng

Secure and Safe Hardware

Département Communications & Electronique

Sylvain Guilley

Function : Author
PersonId : 16208
IdHAL : sylvain-guilley
ORCID : 0000-0002-5044-3534
IdRef : 116845953

Secure and Safe Hardware

Secure-IC S.A.S

Naghmeh Karimi

Function : Author

University of Maryland [Baltimore County]

Trevor Kroeger

Function : Author

University of Maryland [Baltimore County]

Domains

Engineering Sciences [physics] Electronics

Jean-Luc Danger : Connect in order to contact the contributor

https://hal.telecom-paris.fr/hal-02946697

Submitted on : Wednesday, September 23, 2020-12:51:41 PM

Last modification on : Tuesday, February 28, 2023-3:36:23 PM

Dates and versions

hal-02946697 , version 1 (23-09-2020)

Identifiers

HAL Id : hal-02946697 , version 1
DOI : 10.23919/DATE48585.2020.9116428

Cite

Jean-Luc Danger, Wei Cheng, Sylvain Guilley, Naghmeh Karimi, Trevor Kroeger. Effect of Aging on PUF Modeling Attacks based on Power Side-Channel Observations. 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2020, Grenoble, France. pp.454-459, ⟨10.23919/DATE48585.2020.9116428⟩. ⟨hal-02946697⟩

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