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Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation

Alexandre Menu Jean-Max Dutertre Jean-Baptiste Rigaud Brice Colombier Pierre-Alain Moellic Jean-Luc Danger 1, 2, 3 
1 COMELEC - Département Communications & Electronique
2 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
3 LTCI - Laboratoire Traitement et Communication de l'Information
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Conference papers
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https://hal.telecom-paris.fr/hal-03034855
Contributor : Jean-Luc Danger Connect in order to contact the contributor
Submitted on : Tuesday, December 1, 2020 - 10:34:35 PM
Last modification on : Thursday, November 18, 2021 - 1:02:02 PM

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INSTITUT-TELECOM | LTCI | COMELEC | SSH | IP_PARIS

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Alexandre Menu, Jean-Max Dutertre, Jean-Baptiste Rigaud, Brice Colombier, Pierre-Alain Moellic, et al.. Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation. 2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), Sep 2020, Milan, Italy. pp.41-48, ⟨10.1109/FDTC51366.2020.00013⟩. ⟨hal-03034855⟩

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