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Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation

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https://hal.telecom-paris.fr/hal-03034855
Contributor : Jean-Luc Danger <>
Submitted on : Tuesday, December 1, 2020 - 10:34:35 PM
Last modification on : Tuesday, September 21, 2021 - 2:16:05 PM

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Alexandre Menu, Jean-Max Dutertre, Jean-Baptiste Rigaud, Brice Colombier, Pierre-Alain Moellic, et al.. Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation. 2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), Sep 2020, Milan, Italy. pp.41-48, ⟨10.1109/FDTC51366.2020.00013⟩. ⟨hal-03034855⟩

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