Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation - Archive ouverte HAL Access content directly
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hal-03034855 , version 1 (01-12-2020)

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Alexandre Menu, Jean-Max Dutertre, Jean-Baptiste Rigaud, Brice Colombier, Pierre-Alain Moellic, et al.. Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation. 2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), Sep 2020, Milan, Italy. pp.41-48, ⟨10.1109/FDTC51366.2020.00013⟩. ⟨hal-03034855⟩
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