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Conference papers
On the Effect of Aging on Digital Sensors
Md Toufiq Hasan Anik
Author
Sylvain Guilley 1, 2, 3
Author IdHAL : sylvain-guilley ORCID : https://orcid.org/0000-0002-5044-3534
Jean-Luc Danger 1, 2, 3
Author IdHAL : jeanluc-danger
Naghmeh Karimi
Author
1
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
2
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (19 Place Marguerite Perey 91120 PALAISEAU - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
3
IP Paris - Institut Polytechnique de Paris (France)
Document type :
Conference papers
Domain :
Complete list of metadatas
https://hal.telecom-paris.fr/hal-03034857
Contributor : Jean-Luc Danger <>
Submitted on : Tuesday, December 1, 2020 - 10:35:54 PM
Last modification on : Thursday, December 10, 2020 - 4:49:40 PM
Contributor : Jean-Luc Danger <>
Submitted on : Tuesday, December 1, 2020 - 10:35:54 PM
Last modification on : Thursday, December 10, 2020 - 4:49:40 PM
Identifiers
- HAL Id : hal-03034857, version 1
- DOI : 10.1109/VLSID49098.2020.00050
Collections
INSTITUT-TELECOM | COMELEC | SSH | LTCI | IP_PARIS
Citation
Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi. On the Effect of Aging on Digital Sensors. 2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID), Jan 2020, Bangalore, India. pp.189-194, ⟨10.1109/VLSID49098.2020.00050⟩. ⟨hal-03034857⟩
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