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On the Effect of Aging on Digital Sensors

Md Toufiq Hasan Anik Sylvain Guilley 1, 2, 3 Jean-Luc Danger 1, 2, 3 Naghmeh Karimi 
1 COMELEC - Département Communications & Electronique
2 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
3 IP Paris - Institut Polytechnique de Paris
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Conference papers
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https://hal.telecom-paris.fr/hal-03034857
Contributor : Jean-Luc Danger Connect in order to contact the contributor
Submitted on : Tuesday, December 1, 2020 - 10:35:54 PM
Last modification on : Thursday, November 18, 2021 - 1:02:02 PM

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INSTITUT-TELECOM | LTCI | COMELEC | SSH | IP_PARIS

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Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi. On the Effect of Aging on Digital Sensors. 2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID), Jan 2020, Bangalore, India. pp.189-194, ⟨10.1109/VLSID49098.2020.00050⟩. ⟨hal-03034857⟩

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