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Conference papers
On the Effect of Aging on Digital Sensors
Md Toufiq Hasan Anik
Author
Sylvain Guilley 1, 2, 3
Author IdHAL : sylvain-guilley ORCID : https://orcid.org/0000-0002-5044-3534
Jean-Luc Danger 1, 2, 3
Author IdHAL : jeanluc-danger ORCID : https://orcid.org/0000-0001-5063-7964
Naghmeh Karimi
Author
1
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
2
SSH - Secure and Safe Hardware (Télécom Paris 19 Place Marguerite Perey 91120 Palaiseau - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (Télécom Paris 19 Place Marguerite Perey 91120 PALAISEAU - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
3
IP Paris - Institut Polytechnique de Paris (France)
Document type :
Conference papers
Domain :
Complete list of metadata
https://hal.telecom-paris.fr/hal-03034857
Contributor : Jean-Luc Danger Connect in order to contact the contributor
Submitted on : Tuesday, December 1, 2020 - 10:35:54 PM
Last modification on : Thursday, November 18, 2021 - 1:02:02 PM
Contributor : Jean-Luc Danger Connect in order to contact the contributor
Submitted on : Tuesday, December 1, 2020 - 10:35:54 PM
Last modification on : Thursday, November 18, 2021 - 1:02:02 PM
Identifiers
- HAL Id : hal-03034857, version 1
- DOI : 10.1109/VLSID49098.2020.00050
Collections
INSTITUT-TELECOM | COMELEC | SSH | LTCI | IP_PARIS
Citation
Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi. On the Effect of Aging on Digital Sensors. 2020 33rd International Conference on VLSI Design and 2020 19th International Conference on Embedded Systems (VLSID), Jan 2020, Bangalore, India. pp.189-194, ⟨10.1109/VLSID49098.2020.00050⟩. ⟨hal-03034857⟩
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