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Conference papers
Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection
Wei Cheng
Author
Claude Carlet
Author
Kouassi Goli
Author
Jean-Luc Danger 1, 2, 3
Author IdHAL : jeanluc-danger
Sylvain Guilley 1, 2, 3
Author IdHAL : sylvain-guilley ORCID : https://orcid.org/0000-0002-5044-3534
1
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
2
SSH - Secure and Safe Hardware (Télécom Paris 19 Place Marguerite Perey 91120 Palaiseau - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (Télécom Paris 19 Place Marguerite Perey 91120 PALAISEAU - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
3
IP Paris - Institut Polytechnique de Paris (France)
Document type :
Conference papers
Domain :
Complete list of metadata
https://hal.telecom-paris.fr/hal-03037597
Contributor : Jean-Luc Danger <>
Submitted on : Thursday, December 3, 2020 - 10:44:05 AM
Last modification on : Tuesday, September 21, 2021 - 2:16:05 PM
Contributor : Jean-Luc Danger <>
Submitted on : Thursday, December 3, 2020 - 10:44:05 AM
Last modification on : Tuesday, September 21, 2021 - 2:16:05 PM
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Identifiers
- HAL Id : hal-03037597, version 1
- DOI : 10.29007/fv2n
Collections
INSTITUT-TELECOM | COMELEC | IP_PARIS | SSH | LTCI
Citation
Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, Aug 2019, atlanta, United States. pp.17, ⟨10.29007/fv2n⟩. ⟨hal-03037597⟩
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