Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection - Archive ouverte HAL

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Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

, , , (1, 2, 3) , (1, 2, 3)

1
2
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Wei Cheng

Function : Author
PersonId : 751842
IdHAL : wei-cheng

Claude Carlet

Function : Author

Kouassi Goli

Function : Author

Jean-Luc Danger

Function : Author
PersonId : 175676
IdHAL : jeanluc-danger
ORCID : 0000-0001-5063-7964

Département Communications & Electronique

Secure and Safe Hardware

Institut Polytechnique de Paris

Sylvain Guilley

Function : Author
PersonId : 16208
IdHAL : sylvain-guilley
ORCID : 0000-0002-5044-3534
IdRef : 116845953

Département Communications & Electronique

Secure and Safe Hardware

Institut Polytechnique de Paris

Domains

Engineering Sciences [physics] Electronics

Jean-Luc Danger : Connect in order to contact the contributor

https://hal.telecom-paris.fr/hal-03037597

Submitted on : Thursday, December 3, 2020-10:44:05 AM

Last modification on : Tuesday, February 28, 2023-3:36:25 PM

Dates and versions

hal-03037597 , version 1 (03-12-2020)

Identifiers

HAL Id : hal-03037597 , version 1
DOI : 10.29007/fv2n

Cite

Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, Aug 2019, atlanta, United States. pp.17, ⟨10.29007/fv2n⟩. ⟨hal-03037597⟩

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