Conference Papers
Year :
Jean-Luc Danger : Connect in order to contact the contributor
https://hal.telecom-paris.fr/hal-03037597
Submitted on : Thursday, December 3, 2020-10:44:05 AM
Last modification on : Tuesday, February 28, 2023-3:36:25 PM
Cite
Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, Aug 2019, atlanta, United States. pp.17, ⟨10.29007/fv2n⟩. ⟨hal-03037597⟩
Collections
24
View
0
Download