Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

Wei Cheng; Claude Carlet; Kouassi Goli; Jean-Luc Danger; Sylvain Guilley

doi:10.29007/fv2n

Conference papers

Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

Wei Cheng Claude Carlet Kouassi Goli Jean-Luc Danger ^{1, 2, 3} Sylvain Guilley ^{1, 2, 3}

1 COMELEC - Département Communications & Electronique

2 SSH - Secure and Safe Hardware

LTCI - Laboratoire Traitement et Communication de l'Information

3 IP Paris - Institut Polytechnique de Paris

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Electronics

Complete list of metadatas

https://hal.telecom-paris.fr/hal-03037597
Contributor : Jean-Luc Danger <>
Submitted on : Thursday, December 3, 2020 - 10:44:05 AM
Last modification on : Friday, December 4, 2020 - 3:30:19 AM

Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

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Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

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