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Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

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https://hal.telecom-paris.fr/hal-03037597
Contributor : Jean-Luc Danger <>
Submitted on : Thursday, December 3, 2020 - 10:44:05 AM
Last modification on : Tuesday, September 21, 2021 - 2:16:05 PM

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Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, Aug 2019, atlanta, United States. pp.17, ⟨10.29007/fv2n⟩. ⟨hal-03037597⟩

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