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Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

Wei Cheng Claude Carlet Kouassi Goli Jean-Luc Danger 1, 2, 3 Sylvain Guilley 1, 2, 3 
1 COMELEC - Département Communications & Electronique
2 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
3 IP Paris - Institut Polytechnique de Paris
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Conference papers
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https://hal.telecom-paris.fr/hal-03037597
Contributor : Jean-Luc Danger Connect in order to contact the contributor
Submitted on : Thursday, December 3, 2020 - 10:44:05 AM
Last modification on : Tuesday, January 18, 2022 - 12:24:01 PM

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INSTITUT-TELECOM | LTCI | COMELEC | SSH | IP_PARIS

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Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, Aug 2019, atlanta, United States. pp.17, ⟨10.29007/fv2n⟩. ⟨hal-03037597⟩

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