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Jean-Luc Danger : Connect in order to contact the contributor
https://hal.telecom-paris.fr/hal-03138833
Submitted on : Thursday, February 11, 2021-2:35:09 PM
Last modification on : Tuesday, February 28, 2023-3:36:24 PM
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Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, et al.. On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. 2020 IEEE 38th International Conference on Computer Design (ICCD), Oct 2020, Hartford, United States. pp.506-509, ⟨10.1109/ICCD50377.2020.00091⟩. ⟨hal-03138833⟩
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