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On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability

Md Toufiq Hasan Anik 1 Mohammad Ebrahimabadi 1 Hamed Pirsiavash 1 Jean-Luc Danger 2, 3, 4 Sylvain Guilley 3, 2, 4 Naghmeh Karimi 1 
1 UMBC - University of Maryland [Baltimore County]
2 COMELEC - Département Communications & Electronique
3 SSH - Secure and Safe Hardware
LTCI - Laboratoire Traitement et Communication de l'Information
4 LTCI - Laboratoire Traitement et Communication de l'Information
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Conference papers
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https://hal.telecom-paris.fr/hal-03138833
Contributor : Jean-Luc Danger Connect in order to contact the contributor
Submitted on : Thursday, February 11, 2021 - 2:35:09 PM
Last modification on : Thursday, November 18, 2021 - 1:02:02 PM

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INSTITUT-TELECOM | LTCI | COMELEC | SSH | IP_PARIS

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Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, et al.. On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. 2020 IEEE 38th International Conference on Computer Design (ICCD), Oct 2020, Hartford, United States. pp.506-509, ⟨10.1109/ICCD50377.2020.00091⟩. ⟨hal-03138833⟩

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