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Conference papers
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability
Md Toufiq Hasan Anik
1
Mohammad Ebrahimabadi
1
Hamed Pirsiavash
1
Jean-Luc Danger
2, 3, 4
Sylvain Guilley
3, 2, 4
Naghmeh Karimi
1
Md Toufiq Hasan Anik 1
Author
Mohammad Ebrahimabadi 1
Author
Hamed Pirsiavash 1
Author
Jean-Luc Danger 2, 3, 4
Author IdHAL : jeanluc-danger
Sylvain Guilley 3, 2, 4
Author IdHAL : sylvain-guilley ORCID : https://orcid.org/0000-0002-5044-3534
Naghmeh Karimi 1
Author
1
UMBC - University of Maryland [Baltimore County] (1000 Hilltop Circle • Baltimore, MD 21250 - United States)
- University of Maryland System (United States)
2
COMELEC - Département Communications & Electronique (46, rue Barrault
75013 Paris - France)
- Télécom ParisTech (46 rue Barrault 75634 Paris Cedex 13 - France)
3
SSH - Secure and Safe Hardware (46 rue Barrault
75013 Paris - France)
- LTCI - Laboratoire Traitement et Communication de l'Information (19 Place Marguerite Perey 91120 PALAISEAU - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
4
LTCI - Laboratoire Traitement et Communication de l'Information (19 Place Marguerite Perey 91120 PALAISEAU - France)
- IMT - Institut Mines-Télécom [Paris] (37-39 Rue Dareau, 75014 Paris - France)
- Télécom Paris (19 Place Marguerite Perey 91120 Palaiseau - France)
Document type :
Conference papers
Domain :
Complete list of metadata
https://hal.telecom-paris.fr/hal-03138833
Contributor : Jean-Luc Danger <>
Submitted on : Thursday, February 11, 2021 - 2:35:09 PM
Last modification on : Monday, February 15, 2021 - 4:48:56 PM
Contributor : Jean-Luc Danger <>
Submitted on : Thursday, February 11, 2021 - 2:35:09 PM
Last modification on : Monday, February 15, 2021 - 4:48:56 PM
Identifiers
- HAL Id : hal-03138833, version 1
- DOI : 10.1109/ICCD50377.2020.00091
Collections
INSTITUT-TELECOM | COMELEC | SSH | LTCI | IP_PARIS
Citation
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, et al.. On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. 2020 IEEE 38th International Conference on Computer Design (ICCD), Oct 2020, Hartford, United States. pp.506-509, ⟨10.1109/ICCD50377.2020.00091⟩. ⟨hal-03138833⟩
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