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, The proposed approach for SET emulation covers a good range of pulse widths, from approximately 500 ps to more than 5 ns, with small pulse distortions. This range is in agreement with that presented in Rezgui et al. (2007), which were characterised by radiation tests, for the same device technology. In general, the pulse distortions caused by the Saboteurs are small
, Étape 3 consiste à simuler le DUT avec le scénario opérationnel souhaité pour générer le fichier de modification de la valeur (VCD -Value Change Dump), à partir duquel la distribution des valeurs d'entrée sont extraits. Le testbench de cette simulation doit utiliser le même Driver utilisé dans le cadre de la simulation, abordé au début de ce section
, Étape 4 consiste à extraire la distribution des valeurs d'entrée du fichier VCD, en générant un rapport avec le pourcentage de temps pendant lequel chaque CLB a été soumis à chaque valeurs d'entrée
, Étape 5 consiste à calculer les susceptibilités SET spécifiques de chaque CLB pour le scénario opérationnel, à l'aide du rapport sur la distribution des valeurs d'entrée et des informations sur les susceptibilités SET. Le résultat est un fichier de rapport avec les susceptibilités SET de chaque CLB utilisé dans le DUT. Cette étape est une modification de l'étape 3 de la version simplifiée
, Étape 6 consiste à générer le testbench utilisé dans le cadre de la simulation
, Étape 7 correspond à la simulation réelle du DUT injectant la distribution pondérée des SET, comme à l'étape 5 de la version simplifiée
, Ajout des saboteurs
, Le processus d'insertion de saboteurs dans le DUT, qui est exactement identique dans les deux versions de la stratégie, se traduit par : 1. au port de l'entité, ajouter le signal d'erreur (SET) et les signaux d'activation pour chaque CLB
, pour chaque CLB, créer un nouveau signal, qui remplace la sortie d'origine du CLB et est utilisé comme entrée des saboteurs
, connecter la sortie du CLB à ce nouveau signal ; et d'estimation SEV prenant en compte à la fois la topologie et la distribution des valeurs d'entrée utilise les susceptibilités SET obtenues comme
, Pour toutes les estimations SEV, nous avons injecté l'équivalent de 1000 SET par transistor, ce qui donne 82000 SET à l'intérieur de chaque CLB
Pour le processus à distribution uniforme, nous avons adopté la susceptibilité moyenne de toutes les configurations combinatoires de la bibliothèque ,
, Les estimations SEV obtenues pour chaque circuit de référence analysé sont présentées dans le Table D.1. Pour chaque référence, Table D.1 inclut la quantité de SE observées dans chaque catégorie d'estimation SEV et la SEV estimée respective
, En considérant uniquement l'effet topologique (stratégie simplifiée), l'erreur moyenne est de 4,70 %. Enfin, la prise en compte de la topologie et de l'effet de distribution des valeurs d'entrée (stratégie complète) entraîne une erreur moyenne de 0,68 %. Le calcul de ces erreurs moyennes